Product Briefing Outline :
i2S OEM Devices, a supplier of on-line and off-line camera based
vision systems for optical defect detection and feature metrology, is
introducing a thin film photovoltaic application specific machine design, the
PV-4000. Utilizing standard software, the inspection system can inspect glass
panel, roll-to-roll metallic, or film substrates, and capture images of visual
defects or out of dimension features.
Problem :
As PV processes work their way out of the lab and into the
manufacturing environment, one of the key requirements is to get the
manufacturing costs down and the efficiencies up. This requires having real
time process feedback as corrections and enhancements are made. The PV-4000 is
the vision system to use at multiple locations in the process to provide the
needed quality information.
Solution :
Typical inspection cells are located for incoming inspection of the
substrate, after metalization, and after scribing. Optical defects such as raw
glass defects, metal surface defects and film defects are detected in the
substrate; and non-uniformity, pin-holes, and contamination in the
metalization layers. Scribe line spacing and edge deletion features can be
trended. All defect data is stored or optionally off loaded to the factory
wide supervisory system. With real time quality information, process engineers
can correct out of spec conditions as they start and have a tool that provides
instant feedback as they adjust the process to its optimum.
Applications:
The system is provided – ‘Turn Key’ and networked into the factory
database for glass panel, roll-to-roll metallic, or film substrates.
Platform :
Depending upon throughput requirements, resolution can be as fine as
5 microns using 8192 pixel linear array cameras and proprietary illumination.
A free defect sample evaluation is provided upon request to document the
detection sensitivity and performance guarantee